Much like the traditional scanning electron microscope (SEM), the field emission scanning electron microscope uses electrons to illuminate a sample, instead of visible light as is used in optical ...
We offer consultation, training and specimen preparation for transmission and scanning electron microscopy, or TEM and SEM. Our equipment includes a 120kV TEM instrument, 6610LV SEM instrument, and a ...
Critical Dimension Scanning Electron Microscopy (CD-SEM) is a powerful tool that enables researchers and manufacturers to visualize and quantify nanoscale features with incredible accuracy, playing a ...
The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...
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