Abstract: This article describes new concepts and algorithms used to generate tests for VLSI scan-design circuits. The new algorithms include: 1. a low-cost fault-independent algorithm (SMART), 2. a ...

Abstract: A comparison is made between various approximations of the line-to-ground capacitance problem in a VLSI environment. It is shown that with up-to-date dimensions, the simple parallel-plate ...

Indore (Madhya Pradesh): A fully indigenously developed semiconductor chip named as "Maa Ahilya DAC Chip" was introduced on ...

Intel secures a jury verdict confirming that Fortress Investment Group controls VLSI Technology, a decision that may overturn ...

The dispute over patented semiconductor technology has seen several dramatic turns during its history. An appellate court in ...

After a three-day jury trial, the U.S. District Court for the Western District of Texas ruled that VLSI Technology LLC and ...