In this article, a novel self-supervised Siamese transformer (S3Transformer) model is proposed to segment silicon wafer surface defects which includes two modules, namely Siamese representation ...
We would like to use cookies to collect information about how you use ons.gov.uk. We use this information to make the website work as well as possible and improve our services.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results